PT Wadya Prima Mulia as the Authorized Distributor for ThermoFisher Scientific in Indonesia, provides Talos F200X G2 TEM Transmission Electron Microscope
TEM microscope for high resolution TEM and STEM with accurate chemical quantification.
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Talos F200X G2 Transmission Electron Microscope
The Thermo Scientific Talos F200X STEM is a scanning transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS) signal detection. 2D/3D chemical characterization with compositional mapping is performed by 4 in-column SDD Super-X detectors with unique cleanliness. The Talos F200X scanning transmission electron microscope allows for the fastest and most precise EDS analysis in all dimensions, along with high-resolution TEM and STEM (HRTEM and HRSTEM) imaging with fast navigation for dynamic microscopy. The Talos F200X scanning transmission electron microscope also features reduced environmental sensitivity; the instrument enclosure moderates the impact of air pressure waves, air flows, and fine temperature variations in the TEM room.
STEM imaging and chemical analysis
The Talos F200X (S)TEM delivers fast, precise, quantitative characterization of nanomaterials in multiple dimensions. With innovative features designed to increase throughput, precision, and ease of use, the Talos F200X (S)TEM is ideal for advanced research and analysis in academic, government, semiconductor and industrial environments.
The need for large area correlative imaging at high resolution has recently increased as it allows researchers to preserve the context of their observations while also providing statistically robust data. Thermo Scientific Maps Software (enabled by Thermo Scientific Velox Software) automatically acquires an array of images across a sample and stitches them together to create one large final image. Image acquisition can even be performed unattended. The APW (Automated Particle Workflow) pack has all the benefits described in this section and adds unique processing on a dedicated processing PC with Thermo Scientific Avizo2D Software. You can get nanoparticle parameters like size, area, perimeter, shape, factor, contacts, etc., in an automated way. The fully automated and unattended software pack enables you to use the Talos F200X (S)TEM 24/7, get much better statistics and significantly improve the repeatability because operator bias is not present.
Align Genie Automation Software eases the learning curve for novice operators, reduces tensions in a multi-user environment, and improves time-to-data for the experienced operator.
Available with a wide range of high-resolution field emissions guns (FEG)
Choose high-brightness X-FEG, or ultra-high-brightness Cold Field Emission Gun (X-CFEG). X-CFEG combines the best (S)TEM imaging with the best energy resolution.
Faster time to chemical composition
Rapid, precise quantitative EDS analysis reveals nanoscale details in 2D and 3D with high cleanliness.
Space for more
Add application-specific in situ sample holders for dynamic experiments.
Highly repeatable data collection
All daily TEM tunings, such as focus, eucentric height, beam shift, condenser aperture, beam tilt pivot points and rotation center are automated, ensuring you always start from optimum imaging conditions. Experiments can be repeated reproducibly, allowing you to focus on your research rather than on instrument operation.
Intuitive software
Thermo Scientific Velox Software offers fast and easy acquisition and analysis of multimodal data.
Better image data
High throughput STEM imaging with simultaneous, multiple signal detection delivers better contrast for high quality images.
High-quality (S)TEM images and accurate EDS
Acquire high-quality TEM or STEM images with the innovative and intuitive Velox Software user interface. Unique EDS absorption correction in Velox Software enables highly accurate quantification.
Increased productivity
Ultra-stable column and remote operation with the SmartCam Camera and constant-power objective lenses for swift mode and high-voltage (HT) switches. Fast and easy switching for multi-user environments.
| HRTEM line resolution | ≤0.10 nm |
| STEM resolution | • ≤0.16 nm (X-FEG) • ≤0.14 nm with 100 pA (X-CFEG) |
| Super-X EDS system | 4 SDD symmetric design, windowless, shutter-protected |
| Electron energy loss spectroscopy (EELS) energy resolution | • ≤0.8 eV (X-FEG) • ≤0.3 eV (X-CFEG |
| Gun brightness at 200 kV | • 1.8×109 A /cm2 srad (X-FEG) • 2.4×109 A /cm2 srad (X-CFEG) |
Process control using electron microscopy
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and failure analysis
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
Semiconductor research and development
Innovation starts with research and development. Learn more about solutions to help you understand innovative structures and materials at the atomic level.
Manufacturing today’s complex semiconductors requires exact process controls. Learn more about advanced metrology and analysis solutions to accelerate yield learnings.
Semiconductor Failure Analysis
Complex semiconductor device structures result in more places for defects to hide. Learn more about failure analysis solutions to isolate, analyze, and repair defects.
Semiconductor materials characterization
Many factors impact yield, performance, and reliability. Learn more about solutions to characterize physical, structural, and chemical properties.
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