PT Wadya Prima Mulia as the Authorized Distributor for ThermoFisher Scientific in Indonesia, provides Talos F200S G2 Transmission Electron Microscope
TEM and STEM analysis for high throughput, high resolution chemical characterization and dynamic observations.
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Talos F200i Transmission Electron Microscope
The Thermo Scientific Talos F200i (S)TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications. Its standard X-Twin pole piece gap—giving the highest flexibility in applications—combined with a reproducibly performing electron column opens opportunities for high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications.
Talos F200i Transmission Electron Microscope advantages
Designed for multi-user and multi-discipline environments, the Talos F200i (S)TEM is also ideal for novice users. It is equipped with the Thermo Scientific Velox user interface, which is immediately familiar since it is shared across all Thermo Scientific TEM platforms. All TEM daily tunings have been automated to provide the best and most reproducible setup. The Align Genie automation software eases the learning curve for novice operators, reduces tensions in a multi-user environment, and improves time-to-data for the experienced operator. A side-entry retractable Energy Dispersive X-ray Spectroscopy (EDS) detector can be added to the configuration to enable chemical analysis.
Compact design
The smaller footprint and dimensions of the Talos F200i facilitate accommodation of this tool in more challenging spaces. In addition, this compact design eases access for service needs while also reducing infrastructure and support costs.
Productivity for all users
To further enhance productivity, especially in multi-user, multi-material environments, the constant-power objective lenses, low-hysteresis design, and remote operation with the SmartCam Camera allow for straightforward reproducible mode and high-tension switches. The Talos F200i (S)TEM also features educational online help. Simply pressing F1 with the mouse hovering over a control panel quickly opens relevant information.
Available with a wide range of high-resolution field emissions guns (FEG)
Choose S-FEG, high-brightness X-FEG, or ultra-high-brightness Cold Field Emission Gun (X-CFEG). X-CFEG combines the best (S)TEM imaging with the best energy resolution.
High-quality STEM/TEM images and accurate EDS
Acquire high-quality TEM or STEM images with the innovative and intuitive Velox Software user interface in very a simple way. Unique EDS absorption correction in Velox Software enables the most accurate quantification.
Increased productivity
Ultra-stable column and remote operation with the SmartCam Camera and constant-power objective lenses for swift mode and high-voltage (HT) switches. Fast and easy switching for multi-user environments.
Large field-of-view imaging at high speed
The 4k × 4k Ceta CMOS camera with its large field of view enables live digital zooming with high sensitivity and high speed over the entire high-tension range.
Available with Dual EDS technology
Choose the best EDS detector for your needs, ranging from a single 30 mm² detector to dual 100 mm² detectors for high throughput (or low-dose) analytics.
Best all-round in situ capabilities
Add tomography or in situ sample holders. Fast cameras, smart software, and our wide X-TWIN objective lens gap enable 3D imaging and in situdata acquisition with minimal compromise to resolution and analytical capabilities.
Most repeatable data
All daily TEM tunings, such as focus, eucentric height, beam shift, condenser aperture, beam tilt pivot points and rotation center are automated, ensuring you always start from optimum imaging conditions. Experiments can be repeated reproducibly, allowing more focus on research instead of the tool.
Compact design
Smaller footprint and dimensions facilitate accommodating this tool in more challenging spaces while reducing infrastructure and support costs.
| TEM | Line resolution: ≤0.10 nm |
| Operating system XX units | • Controller: Windows® 10 • Remote controllable: Yes |
| Vacuum system | • Airlock pumping: Oil- and vibration-free • Cold trap: Standard • Long-duration Dewar: Optional – at least 4 days stand-time (between refills) |
| STEM imaging | • STEM resolution: • ≤0.16 nm (S-FEG/X-FEG) • ≤0.14 nm with 100pA (X-CFEG) • Detectors: HAADF and/or On-axis Panther BF/DF |
| Energy disersive x-ray spectroscopy (EDS) | • Detector size (Bruker X-flash): 30, 100 or dual 100 mm2 • Retractable: Yes, motorized |
| Electron energy loss spectroscopy (EELS) | • ≤0.8 eV (S-FEG/X-FEG) • ≤0.3 eV (X-CFEG) |
| Gun brightness 200 kV | • 4×108 A /cm2 srad (S-FEG) • 1.8×109 A /cm2 srad (X-FEG) • 2.4×109 A /cm2 srad (X-CFEG) |
Process control using electron microscopy
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and failure analysis
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
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