X-ray photoelectron spectroscopy
The Thermo Scientific Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of experiments now possible. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications.
High-performance X-ray source
The X-ray monochromator allows selection of analysis area from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.
Optimized electron optics
The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.
Sample viewing
Bring sample features into focus with the K-Alpha XPS System’s patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.
Insulator analysis
The patented dual-beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.
Depth profiling
Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.
Digital Control
Intuitive operation—guided by the Avantage data system—makes the K-Alpha XPS System ideal for both multi-user, shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.
Optional sample holders
Specialist sample holders for angle-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.
NX sample heater module
Fully software-controlled sample heating option, enabling temperature-dependent studies.
| Analyzer type | 180°, double-focusing, hemispherical analyzer with 128-channel detector |
| X-ray source type | Monochromated, micro-focused, low-power Al K-Alpha X-ray source |
| X-ray spot size | 10–400 µm (adjustable in 5 µm steps) |
| Depth profiling | EX06 monatomic ion source or MAGCIS dual-mode ion source |
| Maximum Sample area | 60 x 60 mm |
| Maximum sample thickness | 20 mm |
| Vacuum system | Two turbo molecular pumps, with automated titanium sublimation pump and backing pump |
| Optional accessories | UPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, NX sample heating module, sample bias module, vacuum transfer module, adaptor for glove box integration |
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