PT Wadya Prima Mulia as the Authorized Distributor for ThermoFisher Scientific in Indonesia, provides Phenom Pure G6 Desktop Scanning Electron Microscope
Desktop SEM that is economical and easy to use, with reliable automation features.
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Phenom Pure Desktop SEM
The Thermo Scientific Phenom Pure Desktop Scanning Electron Microscope (SEM) is an ideal tool for the transition from light optical to electron microscopy. It is an economical solution for high-resolution imaging, providing the best imaging results in its class.
The Phenom Pure Desktop SEM provides high-quality images thanks to the long-lasting, high-brightness CeB6 source, and offers the market’s fastest loading and imaging time. The very reliable autofocus and automated source alignments make this the most user-friendly system on the market.
Never lost navigation
The user always knows the position on the sample with the unique never lost navigation. Overviews of both the optical and electron optical images provide clear reference points at all times. Thanks to the integrated motorized stage, you can navigate quickly through your sample.
Easy to use
Users are ready to take images after only 10 minutes of basic training. A large variety of sample holders is available to accommodate a large range of samples. Sample loading is fast and safe due to our patented sample vacuum loading technology.
Customize your SEM
The Phenom Pure Desktop SEM can be equipped with two optional detector systems. The first one is a fully integrated energy dispersive spectroscopy (EDS) system. The second is a secondary electron detector (SED) for applications that require surface and topography sensitive imaging.
| Light optical magnification | Fixed 27x |
| Electron optical magnification range | 160–175,000x |
| Resolution | ≤15 nm |
| Digital zoom | Max. 12x |
| Light optical navigation camera | Color |
| Acceleration voltages | Default: 5 kV and 10 kV |
| Vacuum modes | • High vacuum mode • Charge-reduction mode via optional low vacuum sample holder |
| Detector | • Backscattered electron detector (standard) • Energy dispersive X-ray spectroscopy detector (optional) • Secondary electron detector (optional) |
| Sample size | • Up to 25 mm diameter • 32 mm (optional) |
| Sample height | • Up to 35 mm • 100 mm (optional) |
Process control using electron microscopy
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and failure analysis
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
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