PT Wadya Prima Mulia as the Authorized Distributor for ThermoFisher Scientific in Indonesia, provides Talos F200S G2 Transmission Electron Microscope
TEM microscope for high productivity, high resolution TEM and STEM characterization with chemical quantification.
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Talos F200S G2 Transmission Electron Microscope
The Thermo Scientific Talos F200S (S)TEM is a (scanning) transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS). The Talos F200S (S)TEM features great versatility and high through in STEM imaging and allows for precise EDS analysis and high-resolution TEM (HRTEM) for dynamic microscopy.
Talos F200S G2 Transmission Electron Microscope advantages
The Thermo Scientific Talos F200S 200kV (S)TEM combines fast, multichannel, high-resolution (S)TEM imaging and precise compositional analysis to enable dynamic microscopy applications. With innovative features designed to increase throughput, precision, and ease of use, the Talos (S)TEM is ideal for advanced research and analysis across academic, government, and industrial research environments.
Intuitive software
Features Thermo Scientific Velox Software for fast and easy acquisition and analysis of multimodal data.
Upgrade
Can be field upgraded to the Thermo Scientific Talos F200X (S)TEM.
Precise chemical composition data
Rapid, precise, quantitative EDS analysis using two in-column Thermo Scientific SDD Super-X Detectors with unique cleanliness, revealing nanoscale details.
Increased stability
Reduced environmental sensitivity thanks to the instrument enclosure, which moderates the impact of air pressure waves, air flows, and fine temperature variations in the TEM room.
Better image data
High-throughput (S)TEM imaging with simultaneous, multiple signal detection delivers better contrast for high quality images.
Space for more
Add application-specific in situ sample holders for dynamic experiments.
| HRTEM line resolution | 0.10 |
| HRSTEM [nm] | 0.16 |
| Total beam current FEG | >150 nA |
| EDS system | 2 SDD windowless design, shutter-protected |
| EDS energy resolution | ≤136 eV for Mn-Kα and 10 kcps (output) |
| Fast EDS mapping | Pixel dwell times down to 10 μs |
| EDS Net solid angle | 0.45 sr |
Process control using electron microscopy
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and failure analysis
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
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